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|Rotation Speed:||500-5000rpm||Diameter:||Max Cutting Diameter Φ60mm|
|Cutting Disc:||Φ200 X1 X32mm||Feed Speed:||0.01-3mm/s|
|Application:||Metal, Electronic Components, Ceramic, Crystals||Power:||220V/50HZ, 1.5Kw|
High-speed Precision Metallographical Cuting Machine with Fixture to Clamp Specimens
iCut-866 Precision cutting machine is suitable for metal, electronic components, ceramic materials, crystals, carbide, rock samples, ore samples, concrete, organic materials, biological materials (teeth, bone) and other materials for precise cutting without distortion .
The machine has the features of high positioning accuracy; large speed range; built-in cooling system; can be preset feed speed; menu-driven control; liquid crystal display.
There are two locations clamp, 9 kinds of fixed cutting method, the user can freely define one kinds of cutting methods; enclosed cutting chamber with safety switch. It is an ideal equipment for industrial and mining enterprises, research institutes and high-quality sample preparation lab.
|MAX cutting diameter||Φ60mm|
|Input voltage||220V 50HZ|
|Maximum stroke||Y 200mm|
|Cutting wheel size||Φ200mm x1mm x32mm|
|Dimension||820mm x735mm x435mm|
When cutting a specimen from a larger piece of material, care must be taken to ensure that it is representative of the features found in the larger sample, or that it contains all the information required to investigate a feature of interest.
One problem is that preparation of the specimen may change the microstructure of the material, for example through heating, chemical attack, or mechanical damage. The amount of damage depends on the method by which the specimen is cut and the material itself.
Cutting with abrasives may cause a high amount of damage, while the use of a low-speed diamond saw can lessen the problems. There are many different cutting methods, although some are used only for specific specimen types. iqualitrol provides the iCut-864 low speed diamond saw for cutting OM (optical microscope), SEM (scanning electron microscope), and even TEM (transmission electron microscope) specimen.