Brief Introduction and Application of Leeb Impact Device
Impact Device C: Reduced impact energy. For surface-hardened components, coatings, thin or impact-sensitive parts (small indentation). Impact energy 3 Nmm, Indenter Tungsten carbide 3mm.
Impact Device D: Most widely used probe. For the majority of testing applications.Impact energy 11 Nmm, Indenter Tungsten carbide 3mm.
Impact Device DC: Short impact device. For applications in restricted spaces, e.g. in bores, cylinders or for measurements in assembled machines. Impact energy 11 Nmm, Indenter Tungsten carbide 3mm.
Impact Device DL: Slim measuring nose. For measurement under extreme space limitations or on the floor of grooves. Impact energy 11 Nmm, Indenter Tungsten carbide 2.8mm.
Impact device E: Diamond indenter. For measurements in extreme hardness ranges (above 50 HRC / 650 HV). Tool steels with high carbide content.Impact energy 11 Nmm, Indenter Polycrystalline diamond 3mm.
Impact Device G: Increased impact energy. Solid components,e.g. heavy-duty casts and forged parts.Impact energy 90 Nmm, indenter Tungsten carbide 5mm.
Impact device S: Ceramic indenter. For measurements in extreme hardness ranges (above 50 HRC / 650 HV). Tool steels with a high carbide content.Impact energy 11 Nmm, indenter Ceramics 3mm.
Contact Person: Mr. Raymond Chung
Tel: 86-13711988687
Fax: 86-769-22784276
| Factory Address:No. 88 Jiaolian Yiheng Rd, Wanjiang District, Dongguan, China, 523046 | |
| Sales office:Room 301, Building No.1, No. 2 Jiaolian Yiheng Rd, Wanjiang District, Dongguan, China, 523046 | |
| +86--13711988687 | |
| sales@iqualitrol.com | |
