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|Model:||PC-25||Positioning:||Positioning Accuracy 0.01mm|
|Speed:||Rotation Speed 10-600rpm||Cutting:||Max Cutting Section 30mmx30mm|
|Motor:||80W||Cutting Disc:||100mm X0.5mm X20mm|
precision cutting machine,
abrasive cutting machine
Precision Diamond Saw Blade Abrasive Cutter with Speed Range 10-600rpm for Fragile Artificial Crystal
iqualitrol PC-25 Low Speed cutting machine is a precision sectioning saw that is designed forcutting various types of materials with minimal deformation. This low speed precision cutter is targetedfor delicate parts by only using gravity fed force.
iqualitrol PC-25 low-speed precision cutter is applicable to accurate cutting of hard materials, especially to high-value fragile artificial crystal.
There are four kinds of fixtures, so the processed workpiece can be cut at the optimal angle. It comes with a limit switch, can work without a watchman.
The spindle has high accuracy of operation, the horizontal feed position of the processed workpiece can slightly be adjusted, and the machine can be power-off automatically after cutting is finished.
|Max moving travel||25mm|
|Cutting wheel size||Φ100mm x0.5mm x20mm|
|MAX cutting section||30mmx30mm|
|Dimension||350mm x305mm x205mm|
When cutting a specimen from a larger piece of material, care must be taken to ensure that it is representative of the features found in the larger sample, or that it contains all the information required to investigate a feature of interest.
One problem is that preparation of the specimen may change the microstructure of the material, for example through heating, chemical attack, or mechanical damage. The amount of damage depends on the method by which the specimen is cut and the material itself.
Cutting with abrasives may cause a high amount of damage, while the use of a low-speed diamond saw can lessen the problems. There are many different cutting methods, although some are used only for specific specimen types. iqualitrol provides the DS600 low speed diamond saw for cutting OM (optical microscope), SEM (scanning electron microscope), and even TEM (transmission electron microscope) specimen.
Contact Person: Mr. Raymond Chung